Residual Stress By In Situ X-Ray Diffraction: Mobility For Measurement, Control & Validation

RESIDUAL STRESS BY IN SITU X-RAY DIFFRACTION: MOBILITY FOR MEASUREMENT, CONTROL & VALIDATION

Content:
This webinar is to introduce the residual stress measurement for various applications. The highlight for this session is the mobility of measurement that can be taken on site, which will reduce time for analysis and giving immediate required results. Discussion for this webinar will focus on the method for measurement, control and validation of the results. This free webinar is aimed for industrial practitioners, researchers, academicians, and postgraduate students organized by Smart Manufacturing Research Institute (SMRI) at UiTM Shah Alam, Malaysia.

Date: 23rd September 2020
Time: 4:00 pm – 6:00 pm MYT
8.00 am - 10.00 am GMT
Registration form: https://forms.gle/EadzcPfm6UB5KTp59
(Invitation will be sent by email

Presented and moderated by:
Dr. Mohd Shahriman Adenan
(Head of Manufacturing, Dynamics & Numerical Computation, SMRI)
Dr. Linus Lau
(Director, RF Station)
Dr. Alessandro Torboli
(X-Ray Marketing Manager, GNR)
Dr. Luca Seralessandri
(X-Ray Department - Technical Director, GNR)

Contact us:
Smart Manufacturing Research Institute (SMRI)
Aras 5, Blok 3, Kompleks Kejuruteraan,
Fakulti Kejuruteraan Mekanikal,
Universiti Teknologi MARA (UiTM), Malaysia
Tel: +603-5543 5161 | Fax: +603-5543 5160
E-Mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
Website: https://smri.uitm.edu.my/


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